1/f noise in MOSFETs with ultrathin gate dielectrics

Author(s)
Gross, Blaine Jeffrey.
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Description
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 1992
 
Includes bibliographical references (p. 176-184).
 
Date issued
1992
URI
http://hdl.handle.net/1721.1/13192
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science
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