Browsing Innovation in Manufacturing Systems and Technology (IMST) by Subject "AFM"
Now showing items 1-2 of 2
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Atomic Force Microscope: Modeling, Simulations, and Experiments
(2002-01)The quality of atomic force microscope (AFM) data strongly depends on scan and controller parameters. Data artifacts can result from poor dynamic response of the instrument. In order to achieve reliable data, dynamic ... -
Investigation of aspect ratio of hole drilling from micro to nanoscale via focused ion beam fine milling
(2005-01)Holes with different sizes from microscale to nanoscale were directly fabricated by focused ion beam (FIB) milling in this paper. Maximum aspect ratio of the fabricated holes can be 5:1 for the hole with large size with ...
