Browsing Innovation in Manufacturing Systems and Technology (IMST) by Subject "atomic force microscope"

Now showing items 1-3 of 3

    • Application of Stereo Imaging to Atomic Force Microscopy 

      Aumond, Bernardo D.; Youcef-Toumi, Kamal (2002-01)
      Metrological data from sample surfaces can be obtained by using a variety of profilometry methods. Atomic Force Microscopy (AFM), which relies on contact inter-atomic forces to extract topographical images of a sample, ...

    • Imaging at the Nano-scale: State of the Art and Advanced Techniques 

      Aumond, Bernardo D.; El Rifai, Osamah M.; Youcef-Toumi, Kamal (2003-01)
      Surface characteristics such as topography and critical dimensions serve as important indicators of product quality and manufacturing process performance especially at the micrometer and the nanometer scales. This paper ...

    • On Dual Actuation in Atomic Force Microscopes 

      El Rifai, Khalid; El Rifai, Osamah M.; Youcef-Toumi, Kamal (2004-01)
      In this paper, the problem of dual actuation in the atomic force microscope (AFM) is analyzed. The use of two actuators to balance the trade-off between bandwidth, range, and precision has been recently extended to ...