Modeling generalized stacking fault in Au using tight-binding potential combined with a simulated annealing method
Author(s)
Cai, Jun; Wang, Jian-Sheng
DownloadHPCES013.pdf (183.7Kb)
Metadata
Show full item recordAbstract
Tight-binding potential combined with a simulated annealing method is used to study the generalized stacking fault structure and energy of gold. The potential is chosen to fit band structures and total energies from a set of first-principles calculations (Phys. Rev. B54, 4519 (1996)). It is found that the relaxed stacking fault energy (SFE) and anti-SFE are equal to 46 and 102 mJ/m², respectively, and in good agreement with the first principles calculations and experiment. In addition, the potential predicts that the c/a of hcp-like stacking fault structure in Au is slightly smaller than the ideal one.
Date issued
2002-01Series/Report no.
High Performance Computation for Engineered Systems (HPCES);
Keywords
generalized stacking fault, tight-binding potential, Au