dc.contributor.author | Buehler, Markus J. | en_US |
dc.coverage.temporal | January (IAP) 2006 | en_US |
dc.date.issued | 2006-01 | |
dc.identifier | 1.978-January(IAP)2006 | |
dc.identifier | local: 1.978 | |
dc.identifier | local: IMSCP-MD5-46ff55d7ad9c4dacee9595e14b2412aa | |
dc.identifier.uri | http://hdl.handle.net/1721.1/45592 | |
dc.description.abstract | The objective is to introduce large-scale atomistic modeling techniques and motivate its importance for solving problems in modern engineering sciences. We demonstrate how atomistic modeling can be successfully applied to understand how materials fail under extreme loading, emphasizing on the competition between ductile and brittle materials failure. We will demonstrate the techniques in describing failure of a copper nano-crystal. | en_US |
dc.language | en-US | en_US |
dc.rights.uri | Usage Restrictions: This site (c) Massachusetts Institute of Technology 2003. Content within individual courses is (c) by the individual authors unless otherwise noted. The Massachusetts Institute of Technology is providing this Work (as defined below) under the terms of this Creative Commons public license ("CCPL" or "license"). The Work is protected by copyright and/or other applicable law. Any use of the work other than as authorized under this license is prohibited. By exercising any of the rights to the Work provided here, You (as defined below) accept and agree to be bound by the terms of this license. The Licensor, the Massachusetts Institute of Technology, grants You the rights contained here in consideration of Your acceptance of such terms and conditions. | en_US |
dc.subject | large-scale atomistic modeling techniques | en_US |
dc.subject | modern engineering sciences | en_US |
dc.subject | atomistic modeling | en_US |
dc.subject | extreme loading | en_US |
dc.subject | ductile and brittle materials failure | en_US |
dc.subject | copper nano-crystal | en_US |
dc.title | 1.978 From Nano to Macro, January (IAP) 2006 | en_US |
dc.title.alternative | From Nano to Macro | en_US |