Browsing RLE Progress Report, No. 045 (1957) by Subject "Crystal Admittance Measurements"

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    • Transistor and Diode Studies 

      Lipsky, A. H.; Hurtig, C. R.; Martindale, R. B.; Jackson, W. D.; Nelson, R. E. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1957-04-15)