Browsing RLE Progress Report, No. 046 (1957) by Subject "Characterization of Probability Distributions for Excess Physical Noise"

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    • Noise in Electron Devices 

      Adler, Richard B.; Haus, Hermann A.; Verma, J. K. D.; Hilibrand, J. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1957-07-15)