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Microwave Electronics

dc.contributor.authorFessenden, T. J.en_US
dc.contributor.authorLitwin, R.en_US
dc.contributor.authorBers, Abrahamen_US
dc.contributor.authorChorney, P.en_US
dc.contributor.authorHolly, S.en_US
dc.contributor.authorSmullin, Louis D.en_US
dc.contributor.authorHaus, Hermann A.en_US
dc.date.accessioned2010-03-03T19:50:14Z
dc.date.available2010-03-03T19:50:14Z
dc.date.issued1959-01-15en_US
dc.identifierRLE_QPR_052_IXen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/52218
dc.descriptionContains research objectives and reports on three research projects.en_US
dc.description.sponsorshipDepartment of the Armyen_US
dc.description.sponsorshipDepartment of the Navyen_US
dc.description.sponsorshipDepartment of the Air Force under Contract AF19(122)-458en_US
dc.description.sponsorshipU. S. Navy (Office of Naval Research) under Contract Nonr-1841(49)en_US
dc.description.sponsorshipLincoln Laboratory, Purchase Order DDL-B222en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1959en_US
dc.relation.ispartofMicrowave Electronicsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 52en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherKlystronsen_US
dc.subject.otherMicrowave Electronicsen_US
dc.subject.otherMeasurements of the Phase Constant of the Slow Wave of a Helix with the Use of the Resonance Methoden_US
dc.subject.otherPlasma Studiesen_US
dc.titleMicrowave Electronicsen_US
dc.typeTechnical Reporten_US


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