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Noise in Electron Devices

dc.contributor.authorFiocco, G.en_US
dc.contributor.authorHaus, Hermann A.en_US
dc.date.accessioned2010-04-24T18:14:10Z
dc.date.available2010-04-24T18:14:10Z
dc.date.issued1963-04-15en_US
dc.identifierRLE_QPR_069_Ven_US
dc.identifier.urihttp://hdl.handle.net/1721.1/53856
dc.descriptionContains a report on a research project.en_US
dc.description.sponsorshipLincoln Laboratory (Purchase Order DDL B-00368)en_US
dc.description.sponsorshipUnited States Armyen_US
dc.description.sponsorshipUnited States Navyen_US
dc.description.sponsorshipUnited States Air Force (Contract AF19(604)-7400)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, April 15, 1963en_US
dc.relation.ispartofRadio Physicsen_US
dc.relation.ispartofNoise in Electron Devicesen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 69en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherNoise in Electron Devicesen_US
dc.subject.otherPhoton Statistics of Optical Maser Outputen_US
dc.titleNoise in Electron Devicesen_US
dc.typeTechnical Reporten_US


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