dc.contributor.author | Billman, K. W. | en_US |
dc.contributor.author | Kukolich, S. G. | en_US |
dc.contributor.author | Golub, R. | en_US |
dc.contributor.author | Searle, Campbell L. | en_US |
dc.contributor.author | Guttrich, G. L. | en_US |
dc.contributor.author | Badessa, R. S. | en_US |
dc.contributor.author | Thornburg, C. O., Jr. | en_US |
dc.contributor.author | Yaffee, M. A. | en_US |
dc.contributor.author | Culter, L. S. | en_US |
dc.contributor.author | Taylor, E. F. | en_US |
dc.contributor.author | Johnston, W. D., Jr. | en_US |
dc.contributor.author | Zacharias, J. R. | en_US |
dc.contributor.author | King, J. G. | en_US |
dc.date.accessioned | 2010-04-24T21:50:50Z | |
dc.date.available | 2010-04-24T21:50:50Z | |
dc.date.issued | 1966-01-15 | en_US |
dc.identifier | RLE_QPR_080_I | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/54157 | |
dc.description | Contains research objectives and reports on two research projects. | en_US |
dc.description.sponsorship | Joint Services Electronics Programs (U. S. Army, U. S. Navy, and U. S. Air Force) under Contract DA 36-039-AMC-03200(E) | en_US |
dc.language.iso | en | en_US |
dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
dc.relation.ispartof | Molecular Beams | en_US |
dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1966 | en_US |
dc.relation.ispartof | General Physics | en_US |
dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 80 | en_US |
dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
dc.subject.other | Molecular Beams | en_US |
dc.subject.other | Some Aspects of the Theory and Measurement of Frequency Fluctuations in Frequency Standards | en_US |
dc.subject.other | Low-Temperature Helium Beam Experiment | en_US |
dc.title | Molecular Beams | en_US |
dc.type | Technical Report | en_US |