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Magnetic Resonance

dc.contributor.authorWaugh, J. S.en_US
dc.date.accessioned2010-04-24T21:51:06Z
dc.date.available2010-04-24T21:51:06Z
dc.date.issued1966-01-15en_US
dc.identifierRLE_QPR_080_IXen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/54161
dc.descriptionContains research objectives.en_US
dc.description.sponsorshipJoint Services Electronics Programs (U. S. Army, U. S. Navy and U. S. Air Force) under Contract DA 36-039-AMC-03200(E)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1966en_US
dc.relation.ispartofGeneral Physicsen_US
dc.relation.ispartofMagnetic Resonanceen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 80en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherMagnetic Resonanceen_US
dc.titleMagnetic Resonanceen_US
dc.typeTechnical Reporten_US


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