12.141 Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry, January (IAP) 2006

Author(s)
Chatterjee, Nilanjan; Grove, Timothy L.
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Alternative title
Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry
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Abstract
Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe. From the course home page: Course Description This lab-oriented course introduces the student to the subject of X-ray spectrometry and micro-scale chemical quantitative analysis of solid samples through an intensive series of hands-on laboratory exercises that use the electron microprobe.
Date issued
2006-01
URI
http://hdl.handle.net/1721.1/55816
Other identifiers
12.141-January(IAP)2006
Other identifiers
12.141
IMSCP-MD5-aae8a5fa8b0e9fb0df31bfa0239f5ac0
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Keywords
x-ray microanalysis, electron microprobe, ZAF matrix corrections, wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging
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