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Gaseous Electronics

dc.contributor.authorRaff, G. J.en_US
dc.contributor.authorFulghum, S. F., Jr.en_US
dc.contributor.authorGeorge, E. Victoren_US
dc.contributor.authorPleasance, L. D.en_US
dc.date.accessioned2010-06-30T21:36:42Z
dc.date.available2010-06-30T21:36:42Z
dc.date.issued1970-01-15en_US
dc.identifierRLE_QPR_098_VIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/56098
dc.descriptionContains reports on two research projects.en_US
dc.description.sponsorshipJoint Services Electronics Programs (U. S. Army, U. S. Navy, and U. S. Air Force) under Contract DA 28-043-AMC-02536(E)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, July 15, 1970en_US
dc.relation.ispartofPlasma Dynamicsen_US
dc.relation.ispartofGaseous Electronicsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 98en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherGaseous Electronicsen_US
dc.subject.otherTime-Dependent Threshold Characteristics of Pulsed Noble Ion Lasersen_US
dc.subject.otherMicrowave Diagnostics of High-Density Laser Plasmasen_US
dc.titleGaseous Electronicsen_US
dc.typeTechnical Reporten_US


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