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dc.contributor.authorKleppner, Danielen_US
dc.contributor.authorPritchard, David E.en_US
dc.contributor.authorChu, F. Y.en_US
dc.contributor.authorWalther, F. G.en_US
dc.contributor.authorPhillips, William D.en_US
dc.contributor.authorJacobson, A. G.en_US
dc.contributor.authorWieman, C. E.en_US
dc.contributor.authorMattison, E. M.en_US
dc.contributor.authorMaloney, T. J.en_US
dc.date.accessioned2010-06-30T21:49:25Z
dc.date.available2010-06-30T21:49:25Z
dc.date.issued1971-01-15en_US
dc.identifierRLE_QPR_100_IIIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/56145
dc.descriptionContains research objectives, summary of research and reports on six research projects.en_US
dc.description.sponsorshipJoint Services Electronics Programs (U. S. Army, U. S. Navy, and U. S. Air Force) under Contract DA 28-043-AMC-02536(E)en_US
dc.description.sponsorshipNational Science Foundation (Grant GP-13633)en_US
dc.description.sponsorshipNational Bureau of Standards (Grant NBS(G)-269)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1971en_US
dc.relation.ispartofGeneral Physicsen_US
dc.relation.ispartofAtomic Resonance and Scatteringen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 100en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherAtomic Resonance and Scatteringen_US
dc.subject.otherAlkali-Molecule Scatteringen_US
dc.subject.otherEffect of Binding on the Magnetic Moment of the Electronen_US
dc.subject.otherMolecular-Beam Studies of Van der Waals Moleculesen_US
dc.subject.otherMerging Atomic Beamsen_US
dc.subject.otherMetastable Helium Sourceen_US
dc.subject.otherMultiple-Resolution Velocity Selectoren_US
dc.titleAtomic Resonance and Scatteringen_US
dc.typeTechnical Reporten_US


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