Browsing RLE Progress Report, No. 129 (1987) by Subject "Algorithmic Fault Tolerance on Digital Signal Processing"

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    • Custom Integrated Circuits 

      Armstrong, Robert C.; Baltus, Donald G.; Bamji, Cyrus S.; Brocco, Lynne M.; Hauck, Charles; e.a. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1987-01)