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dc.contributor.authorAllen, Jonathanen_US
dc.contributor.authorPenfield, Paul L., Jr.en_US
dc.contributor.authorRivest, Ronald L.en_US
dc.contributor.authorSussman, Gerald J.en_US
dc.contributor.authorShrobe, Howarden_US
dc.contributor.authorGlasser, Lance A.en_US
dc.contributor.authorWyatt, John L., Jr.en_US
dc.contributor.authorBain, Isaacen_US
dc.contributor.authorZukowski, Charlesen_US
dc.contributor.authorMatson, Marken_US
dc.contributor.authorTan, Han-Ngeeen_US
dc.contributor.authorYew, Pearlen_US
dc.contributor.authorO'Brien, Peteren_US
dc.date.accessioned2010-07-15T21:48:02Z
dc.date.available2010-07-15T21:48:02Z
dc.date.issued1984-01en_US
dc.identifierRLE_PR_126_25en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/56892
dc.descriptionContains reports on four research projects.en_US
dc.description.sponsorshipU.S. Air Force - Office of Scientific Research (Contract F49620-81-C-0054)en_US
dc.description.sponsorshipU.S. Air Force - Office of Scientific Research (Contract F49620-84-C-0004)en_US
dc.description.sponsorshipNational Science Foundation (Grant ECS81-18160)en_US
dc.description.sponsorshipNational Science Foundation (Grant ECS83-10941)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1984en_US
dc.relation.ispartofCustom Integrated Circuitsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 126en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherCustom Integrated Circuitsen_US
dc.subject.otherConversion of Algorithms to Custom Integrated Circuitsen_US
dc.subject.otherCircuit Theory for Digital VLSI Systemsen_US
dc.subject.otherVery Large Scale Integrated Circuit Researchen_US
dc.subject.otherWaveform Bounding for Fast Timing Analysis of MOS VLSI Circuitsen_US
dc.titleCustom Integrated Circuitsen_US
dc.typeTechnical Reporten_US


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