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dc.contributor.authorMelngailis, Johnen_US
dc.contributor.authorLezec, Henri J.en_US
dc.contributor.authorMusil, Christian R.en_US
dc.contributor.authorMahoney, Leonard J.en_US
dc.contributor.authorChu, Alexen_US
dc.contributor.authorChu, Larryen_US
dc.contributor.authorAntoniadis, Dimitri A.en_US
dc.contributor.authorVignaud, Dominiqueen_US
dc.contributor.authorLiao, Kenneth S.en_US
dc.contributor.authorShimase, Akiraen_US
dc.contributor.authorChung, James E.en_US
dc.contributor.authorEtchin, Sergeyen_US
dc.contributor.authorKazior, Thomas E.en_US
dc.contributor.authorRo, Jaesangen_US
dc.contributor.authorThompson, Carl V.en_US
dc.contributor.authorChiang, Tony P.en_US
dc.contributor.authorChu, Williamen_US
dc.contributor.authorSmith, Henry I.en_US
dc.contributor.authorHartney, Mark A.en_US
dc.contributor.authorShaver, D. C.en_US
dc.contributor.authorXu, Xinen_US
dc.contributor.authorDella Ratta, Anthony D.en_US
dc.contributor.authorSosonkina, Janeen_US
dc.date.accessioned2010-07-16T04:32:32Z
dc.date.available2010-07-16T04:32:32Z
dc.date.issued1991-01-01 to 1991-12-31en_US
dc.identifierRLE_PR_134_01_01s_06en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57199
dc.descriptionContains an introduction, reports on seven research projects and a list of publications.en_US
dc.description.sponsorshipDefense Advanced Research Projects Agency/U.S. Army Research Office Contract DAAL03-88-K-0108en_US
dc.description.sponsorshipNational Science Foundation Grant ECS 89-21728en_US
dc.description.sponsorshipU.S. Army Research Office Contract DAAL03-87-K-0126en_US
dc.description.sponsorshipU.S. Navy - Naval Research Laboratory/Micrion Agreement M08774en_US
dc.description.sponsorshipSEMATECHen_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1991en_US
dc.relation.ispartofSolid State Physics, Electronics and Opticsen_US
dc.relation.ispartofMaterials and Fabricationen_US
dc.relation.ispartofFocused Ion Beam Microfabricationen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 134en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherFocused Ion Beam Microfabricationen_US
dc.subject.otherTunable Gunn Diodesen_US
dc.subject.otherHigh Frequency Performance of Tunable Gunn Diodesen_US
dc.subject.otherApplications of Tunable Gunn Diodesen_US
dc.subject.otherSimulation of Tunable Gunn Diodes with Doping Gradientsen_US
dc.subject.otherSimulation of MESFETs with Doping Gradientsen_US
dc.subject.otherLimited Lateral Straggle of Focused-Ion-Beam Implantsen_US
dc.subject.otherFocused Ion Beam Implantation of GaAs MMICsen_US
dc.subject.otherFocused Ion Beam Implantation of Transistor Optimizationen_US
dc.subject.otherIon Induced Deposition of Golden_US
dc.subject.otherIon Induced Deposition of Modelsen_US
dc.subject.otherIon Induced Deposition of Microstructureen_US
dc.subject.otherFocused Ion Beam Lithography for X-Ray Mask Makingen_US
dc.subject.otherFocused Ion Beam for the Repair of X-Ray Masksen_US
dc.titleFocused Ion Beam Microfabricationen_US
dc.typeTechnical Reporten_US


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